[IEEE 2013 3rd International Conference on Instrumentation, Communications, Information Technology, and Biomedical Engineering (ICICI-BME) - Bandung, Indonesia (2013.11.7-2013.11.8)] 2013 3rd International Conference on Instrumentation, Communications, Information Technology and Biomedical Engineering (ICICI-BME) - Modeling of tunneling currents on Al/SiO2/p-Si MOS capacitors with nanometer-thick oxides
Mulyanti, Budi, Hasanah, Lilik, Pantjawati, Arjuni B., Murakami, Hideki, Khairurrijal,Year:
2013
Language:
english
DOI:
10.1109/icici-bme.2013.6698505
File:
PDF, 170 KB
english, 2013