Automatic Constraint Based Test Generation for Behavioral...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2008 / 04 Vol. 16; Iss. 4

Automatic Constraint Based Test Generation for Behavioral HDL Models

Hari, Siva Kumar Sastry, Konda, Vishnu Vardhan Reddy, V, Kamakoti, Vedula, Vivekananda M., Maneperambil, Kailasnath S.
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Volume:
16
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2008.917424
Date:
April, 2008
File:
PDF, 790 KB
english, 2008
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