[IEEE 2013 IEEE CPMT Symposium Japan (Formerly VLSI Packaging Workshop of Japan) - Kyoto, Japan (2013.11.11-2013.11.13)] 2013 3rd IEEE CPMT Symposium Japan - The effect of surface roughness on high frequency transmission line
Iwai, Toshiki, Mizutani, Daisuke, Tani, MotoakiYear:
2013
Language:
english
DOI:
10.1109/icsj.2013.6756086
File:
PDF, 585 KB
english, 2013