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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate
Chung, Jaeyong, Park, Joonsung, Abraham, Jacob A., Byun, Eonjo, Woo, Cheol-JongYear:
2010
Language:
english
DOI:
10.1109/vts.2010.5469625
File:
PDF, 554 KB
english, 2010