Estimation of gate-to-channel tunneling current in...

Microelectronics Journal 2007 Vol. 38; Iss. 8-9

Estimation of gate-to-channel tunneling current in ultra-thin oxide sub-50 nm double gate devices

Saibal Mukhopadhyay, Keunwoo Kim, Jae-Joon Kim, Shih-Hsien Lo, Rajiv V. Joshi, Ching-Te Chuang, Kaushik Roy
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Volume:
38
Year:
2007
Language:
english
Pages:
11
DOI:
10.1016/j.mejo.2006.03.010
File:
PDF, 465 KB
english, 2007
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