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Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET
M. Alwan, B. Beydoun, K. Ketata, M. ZoaeterVolume:
38
Year:
2007
Language:
english
Pages:
8
DOI:
10.1016/j.mejo.2007.04.015
File:
PDF, 1.16 MB
english, 2007