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A prognostic method for the embedded failure monitoring of solder interconnections with 1149.4 test bus architecture
Juha Voutilainen, Jussi Putaala, Markku Moilanen, Heli JantunenVolume:
40
Year:
2009
Language:
english
Pages:
12
DOI:
10.1016/j.mejo.2007.09.009
File:
PDF, 357 KB
english, 2009