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Deep-level defects study of arsenic-implanted ZnO single crystal
C.Y. Zhu, C.C. Ling, G. Brauer, W. Anwand, W. SkorupaVolume:
40
Year:
2009
Language:
english
Pages:
3
DOI:
10.1016/j.mejo.2008.07.037
File:
PDF, 268 KB
english, 2009