[IEEE 2002 IEEE International Symposium on Virtual and Intelligent Measurement Systems - Girdwood, AK, USA (19-20 May 2002)] 2002 IEEE International Symposium on Virtual and Intelligent Measurement Systems (IEEE Cat. No.02EX545) - Artificial intelligence in science of measurements and the evolution of the measurements instruments: a perspective conception
Amigoni, F., Brandolini, A., D'Antona, G., Ottoboni, R., Somalvico, M.Year:
2002
Language:
english
DOI:
10.1109/vims.2002.1009352
File:
PDF, 604 KB
english, 2002