[IEEE ESSDERC 2003. 33rd European Solid-State Device...

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[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - Impact of technology scaling on the input and output features of RF-MOSFETs: effects and modeling

Torres-Torres, R., Murphy-Arteaga, R., Augendre, E., Decoutere, S.
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Year:
2003
Language:
english
DOI:
10.1109/essderc.2003.1256872
File:
PDF, 303 KB
english, 2003
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