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[IEEE 2009 Second International Conference on Dependability (DEPEND) - Athens/Glyfada, Greece (2009.06.18-2009.06.23)] 2009 Second International Conference on Dependability - Development of Applications Based on Security Patterns
Serrano, Daniel, Ruiz, José F., Munoz, Antonio, Mana, Antonio, Armenteros, Alvaro, Crespo, Beatriz Gallego-NicasoYear:
2009
Language:
english
DOI:
10.1109/depend.2009.23
File:
PDF, 244 KB
english, 2009