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[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - A layout-aware x-filling approach for dynamic power supply noise reduction in at-speed scan testing
Kiamehr, Saman, Firouzi, Farshad, Tahoori, Mehdi B.Year:
2013
Language:
english
DOI:
10.1109/ets.2013.6569356
File:
PDF, 374 KB
english, 2013