[IEEE 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Minneapolis, MN (2013.05.6-2013.05.9)] 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - A novel biaxial probe implementing multifrequency excitation and SVM processing for NDT
Bernieri, Andrea, Betta, Giovanni, Ferrigno, Luigi, Laracca, MarcoYear:
2013
Language:
english
DOI:
10.1109/i2mtc.2013.6555425
File:
PDF, 1.06 MB
english, 2013