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[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Efficient pattern mapping for deterministic logic BIST
Gherman, V., Wunderlich, H.-J., Vranken, H., Hapke, F., Wittke, M., Garbers, M.Year:
2004
Language:
english
DOI:
10.1109/test.2004.1386936
File:
PDF, 546 KB
english, 2004