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[IEEE 2011 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2011.10.16-2011.10.20)] 2011 IEEE International Integrated Reliability Workshop Final Report - On the microscopic limit of the reaction-diffusion model for the negative bias temperature instability
Schanovsky, Franz, Grasser, TiborYear:
2011
Language:
english
DOI:
10.1109/iirw.2011.6142578
File:
PDF, 2.79 MB
english, 2011