Investigation of silicon sensor quality as a function of...

IEEE Transactions on Nuclear Science 2002 / 02 Vol. 49; Iss. 1

Investigation of silicon sensor quality as a function of the ohmic side processing technology

Bloch, P., Cheremukhin, A., Golubkov, S., Golutvin, I., Egorov, N., Konjkov, K., Kozlov, Y., Peisert, A., Sidorov, A., Zamiatin, N.
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Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2002.998662
Date:
February, 2002
File:
PDF, 224 KB
english, 2002
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