Normalized mutual integral difference method to extract...

IEEE Electron Device Letters 2002 / 07 Vol. 23; Iss. 7

Normalized mutual integral difference method to extract threshold voltage of MOSFETs

Jin He,, Xuemei Xi,, Mansun Chan,, Kanyu Cao,, Chenming Hu,, Yingxue Li,, Xing Zhang,, Ru Huang,, Yangyuan Wang,
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Volume:
23
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2002.1015230
Date:
July, 2002
File:
PDF, 194 KB
english, 2002
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