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[IEEE 2010 IEEE International Symposium on Biomedical Imaging: From Nano to Macro - Rotterdam, Netherlands (2010.04.14-2010.04.17)] 2010 IEEE International Symposium on Biomedical Imaging: From Nano to Macro - Nonrigid registration with differential bias correction using normalised mutual information
Modat, Marc, Ridgway, Gerard R., Hawkes, David J., Fox, Nick C., Ourselin, SebastienYear:
2010
Language:
english
DOI:
10.1109/isbi.2010.5490337
File:
PDF, 225 KB
english, 2010