[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Standard Silicon CMOS Device uses for developing a Biological Sensor
Volynsky, Eduard, Frenkel-Ben-Yakar, Lilac, Sternberg, YehudaYear:
2006
Language:
english
DOI:
10.1109/ipfa.2006.251047
File:
PDF, 3.14 MB
english, 2006