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[IEEE 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Shangri-La's Rasa Sentosa Resort, Singapore (27 June-1July, 2005)] Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Laser beam induced dielectric cracks in VLSI devices
Maury, A., Schaller, J., Goh Chia Lan,, Yaacob, I.I., Chua Choon Meng,, Tan Soon Huat,, Maznev, A., Gomez, K.Year:
2005
Language:
english
DOI:
10.1109/ipfa.2005.1469122
File:
PDF, 630 KB
english, 2005