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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - A comprehensive framework for predictive modeling of negative bias temperature instability
Chakravarthi, S., Krishnan, A., Reddy, V., Machala, C.F., Krishnan, S.Year:
2004
Language:
english
DOI:
10.1109/relphy.2004.1315337
File:
PDF, 608 KB
english, 2004