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[IEEE 2008 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Atlanta, GA, USA (2008.06.17-2008.04.17)] 2008 IEEE Radio Frequency Integrated Circuits Symposium - Statistical variations in VCO phase noise due to upconverted MOSFET 1/f noise
Erturk, M., Xia, T., Wolf, R. L., Scagnelli, D. P., Clark, W. F.Year:
2008
Language:
english
DOI:
10.1109/rfic.2008.4561430
File:
PDF, 564 KB
english, 2008