[IEEE 2007 IEEE International Conference on Microelectronic Test Structures - Bunkyo-ku, Japan (2007.03.19-2007.03.22)] 2007 IEEE International Conference on Microelectronic Test Structures - A 1 Mbit SRAM test structure to analyze local mismatch beyond 5 sigma variation
Fischer, Thomas, Otte, Christopher, Schmitt-Landsiedel, Doris, Amirante, Ettore, Olbrich, Alexander, Huber, Peter, Ostermayr, Martin, Nirschl, Thomas, Einfeld, JanYear:
2007
Language:
english
DOI:
10.1109/icmts.2007.374456
File:
PDF, 2.86 MB
english, 2007