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Light Switched Plasma Charging Protection Device for High-Field Characterization and Flash Memory Protection
Sommer, Sebastian P., Paschen, Uwe, Figge, Martin, Vogt, HolgerVolume:
11
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2010.2088399
Date:
March, 2011
File:
PDF, 610 KB
english, 2011