Pressure and scattering regime influence on the EDS profile...

Micron 2011 Vol. 42; Iss. 8

Pressure and scattering regime influence on the EDS profile resolution at a composite interface in environmental SEM

Claire Arnoult, Jean Di Martino, Lahcen Khouchaf, Valérie Toniazzo, David Ruch
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Volume:
42
Year:
2011
Language:
english
Pages:
7
DOI:
10.1016/j.micron.2011.06.004
File:
PDF, 536 KB
english, 2011
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