Reliability and performance scaling of very high speed SiGe...

Reliability and performance scaling of very high speed SiGe HBTs

Greg Freeman, Jae-Sung Rieh, Zhijian Yang, Fernando Guarin
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Volume:
44
Year:
2004
Language:
english
Pages:
14
DOI:
10.1016/j.microrel.2003.11.003
File:
PDF, 397 KB
english, 2004
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