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Reliability and performance scaling of very high speed SiGe HBTs
Greg Freeman, Jae-Sung Rieh, Zhijian Yang, Fernando GuarinVolume:
44
Year:
2004
Language:
english
Pages:
14
DOI:
10.1016/j.microrel.2003.11.003
File:
PDF, 397 KB
english, 2004