Effects of radiation and charge trapping on the reliability of high-κ gate dielectrics
J.A Felix, J.R Schwank, D.M Fleetwood, M.R Shaneyfelt, E.P GusevVolume:
44
Year:
2004
Language:
english
Pages:
13
DOI:
10.1016/j.microrel.2003.12.005
File:
PDF, 371 KB
english, 2004