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[IEEE Comput. Soc. Press [1989] International Conference on Wafer Scale Integration - San Francisco, CA, USA (3-5 Jan. 1989)] [1989] Proceedings International Conference on Wafer Scale Integration - Overlapped subarray testing for wafer scale integration
Malek, M., Swartzlander, E.E.Year:
1989
Language:
english
DOI:
10.1109/wafer.1989.47564
File:
PDF, 358 KB
english, 1989