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[IEEE 2013 IEEE 31st International Conference on Computer Design (ICCD) - Asheville, NC, USA (2013.10.6-2013.10.9)] 2013 IEEE 31st International Conference on Computer Design (ICCD) - LPScan: An algorithm for supply scaling and switching activity minimization during test
Potluri, Seetal, Adireddy, Satya Trinadh, Rajamanikkam, Chidhambaranathan, Balachandran, ShankarYear:
2013
Language:
english
DOI:
10.1109/iccd.2013.6657083
File:
PDF, 277 KB
english, 2013