Optimizing the hot carrier reliability of N-LDMOS...

Microelectronics Reliability 2005 Vol. 45; Iss. 7-8

Optimizing the hot carrier reliability of N-LDMOS transistor arrays

Douglas Brisbin, Andy Strachan, Prasad Chaparala
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Volume:
45
Year:
2005
Language:
english
Pages:
12
DOI:
10.1016/j.microrel.2004.11.054
File:
PDF, 791 KB
english, 2005
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