Study of Area Scaling Effect on Integrated Circuit...

Microelectronics Reliability 2005 Vol. 45; Iss. 9-11

Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models

Changsoo Hong, Linda Milor, Munkang Choi, Tom Lin
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Volume:
45
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2005.07.011
File:
PDF, 656 KB
english, 2005
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