Negative bias temperature instability mechanisms in...

Microelectronics Reliability 2005 Vol. 45; Iss. 9-11

Negative bias temperature instability mechanisms in p-channel power VDMOSFETs

N. Stojadinović, D. Danković, S. Djorić-Veljković, V. Davidović, I. Manić, S. Golubović
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Volume:
45
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2005.07.018
File:
PDF, 405 KB
english, 2005
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