Seebeck Effect Detection on Biased Device without OBIRCH...

Microelectronics Reliability 2005 Vol. 45; Iss. 9-11

Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout

Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki
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Volume:
45
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2005.07.041
File:
PDF, 1.90 MB
english, 2005
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