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SRAM cell defect isolation methodology by sub micron probing technique
F. Sibileau, C. Ali, C. Giret, D. FaureVolume:
45
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2005.07.046
File:
PDF, 1.20 MB
english, 2005