Advanced electrical analysis of embedded memory cells using...

Microelectronics Reliability 2005 Vol. 45; Iss. 9-11

Advanced electrical analysis of embedded memory cells using atomic force probing

M. Grützner
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Volume:
45
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2005.07.054
File:
PDF, 1.61 MB
english, 2005
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