[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Power-on contention: a reliability issue for logic devices
Muniandy, R., Miller, S., Lim Yew Tee,, Boylan, R.Year:
1995
Language:
english
DOI:
10.1109/ipfa.1995.487589
File:
PDF, 344 KB
english, 1995