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New experimental approach for failure prediction in electronics: Topography and deformation measurement complemented with acoustic microscopy
Isaline Richard, Romain Fayolle, Jean-Claude LecomteVolume:
45
Year:
2005
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2005.07.071
File:
PDF, 8.71 MB
english, 2005