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A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications
A. Sozza, C. Dua, E. Morvan, B. Grimber, S.L. DelageVolume:
45
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2005.07.081
File:
PDF, 490 KB
english, 2005