A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and...

A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications

A. Sozza, C. Dua, E. Morvan, B. Grimber, S.L. Delage
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
45
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2005.07.081
File:
PDF, 490 KB
english, 2005
Conversion to is in progress
Conversion to is failed