Thermal and electrostatic reliability characterization in...

Microelectronics Reliability 2005 Vol. 45; Iss. 9-11

Thermal and electrostatic reliability characterization in RF MEMS switches

Q.-H. Duong, L. Buchaillot, D. Collard, P. Schmitt, X. Lafontan, P. Pons, F. Flourens, F. Pressecq
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Volume:
45
Year:
2005
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2005.07.095
File:
PDF, 436 KB
english, 2005
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