[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Heavy-ion induced single event upsets in phase-change memories
Gerardin, S., Bagatin, M., Paccagnella, A., Visconti, A., Bonanomi, M., Beltrami, S., Frost, C., Ferlet-Cavrois, V.Year:
2014
Language:
english
DOI:
10.1109/irps.2014.6860586
File:
PDF, 271 KB
english, 2014