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[IEEE 1995 IEEE International Symposium on Electronics and the Environment ISEE (Cat. No.95CH35718) - Orlando, FL, USA (1-3 May 1995)] Proceedings of the 1995 IEEE International Symposium on Electronics and the Environment ISEE (Cat. No.95CH35718) - Reliability assessment of used parts: an enabler for asset recovery
Reyes, W., Moore, M., Bartholomew, C.R.M., Currence, R., Siegel, R.Year:
1995
Language:
english
DOI:
10.1109/isee.1995.514956
File:
PDF, 510 KB
english, 1995