[IEEE 2006 7th International Conference on Electronic Packaging Technology - Shanghai, China (2006.08.26-2006.08.29)] 2006 7th International Conference on Electronic Packaging Technology - ESD Models and Measurement for Semiconductor Device
Guo, Zhijun, Tu, Xinya, Pan, Jiangen, Lu, FeiYear:
2006
Language:
english
DOI:
10.1109/icept.2006.359859
File:
PDF, 5.14 MB
english, 2006