RF ESD protection strategies: Codesign vs. low-C protection

Microelectronics Reliability 2007 Vol. 47; Iss. 7

RF ESD protection strategies: Codesign vs. low-C protection

W. Soldner, M. Streibl, U. Hodel, M. Tiebout, H. Gossner, D. Schmitt-Landsiedel, J.H. Chun, C. Ito, R.W. Dutton
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Volume:
47
Year:
2007
Language:
english
Pages:
8
DOI:
10.1016/j.microrel.2006.11.007
File:
PDF, 1.02 MB
english, 2007
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