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[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - Temperature dependent electrical characteristics of silicide/silicon junctions
Horvath, Zs.J., Donoval, D., Peto, G., Molnar, G., Van Tuyen, V.Year:
2000
Language:
english
DOI:
10.1109/asdam.2000.889448
File:
PDF, 273 KB
english, 2000