Measurement of the transient junction temperature in MOSFET devices under operating conditions
D. Barlini, M. Ciappa, M. Mermet-Guyennet, W. FichtnerVolume:
47
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2007.07.008
File:
PDF, 564 KB
english, 2007