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Degradation mechanism understanding of NLDEMOS SOI in RF applications
D. Lachenal, A. Bravaix, F. Monsieur, Y. Rey-TauriacVolume:
47
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2007.07.024
File:
PDF, 333 KB
english, 2007