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Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress
F.V. Farmakis, G.P. Kontogiannopoulos, D.N. Kouvatsos, A.T. VoutsasVolume:
47
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2007.07.030
File:
PDF, 194 KB
english, 2007