Applications of DCIV method to NBTI characterization

Microelectronics Reliability 2007 Vol. 47; Iss. 9-11

Applications of DCIV method to NBTI characterization

A. Neugroschel, G. Bersuker, R. Choi
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Volume:
47
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2007.07.037
File:
PDF, 269 KB
english, 2007
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