![](/img/cover-not-exists.png)
TLP Characterization of large gate width devices
P. Coppens, G. Jenicot, H. Casier, F. De Pestel, F. Depuydt, N. Martens, P. MoensVolume:
47
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2007.07.041
File:
PDF, 552 KB
english, 2007