A study of metamorphic HEMT technological improvements:...

A study of metamorphic HEMT technological improvements: Impact on parasitic effect electrical models

O. Pajona, C. Aupetit-Berthelemot, J.M. Dumas
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Volume:
47
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2007.07.063
File:
PDF, 1.16 MB
english, 2007
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