A study of metamorphic HEMT technological improvements: Impact on parasitic effect electrical models
O. Pajona, C. Aupetit-Berthelemot, J.M. DumasVolume:
47
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2007.07.063
File:
PDF, 1.16 MB
english, 2007